Nova Measuring Instruments LTD. designs, develops, produces, and sells optical process control solutions used in the manufacturing process of semiconductor integrated circuits. It offers in-line stand-alone and integrated metrology systems that attach to process equipment and measure various thin film properties and critical circuit dimensions during various steps in the semiconductor manufacturing process. The company’s products include metrology systems for thin film measurement that is used in chemical mechanical polishing and chemical vapor deposition applications; optical CD and metal line thickness systems for use in post-copper chemical mechanical polishing applications; and optical critical dimension systems for lithography and etch applications. Its products also comprise integrated thickness monitoring systems for chemical mechanical polishing process control that enables wafer-to-wafer closed loop control. The company serves various sectors of the integrated circuit manufacturing industry, including logic, ASIC, foundries, and memory manufactures, as well as process equipment manufacturers worldwide. Nova Measuring Instruments LTD. was founded in 1993 and is headquartered in Rehovot, Israel.