Nova Measuring Instruments Ltd., together with its subsidiaries, engages in the design, development, production, and marketing of integrated process control metrology systems and stand-alone metrology solutions used in the manufacturing process of semiconductors. Its metrology systems measure various thin film properties and critical circuit dimensions during various steps in the semiconductor manufacturing process. The company’s products include metrology systems for thin film measurement used in chemical mechanical polishing and chemical vapor deposition applications; optical CD and metal line thickness systems for use in post-copper chemical mechanical polishing applications; and optical critical dimension systems for lithography and etch applications. It also offers integrated thickness monitoring systems for chemical mechanical polishing process control that enable wafer-to-wafer closed loop control. The company serves various sectors of the integrated circuit manufacturing industry, including logic, ASIC, foundries, and memory manufactures, as well as process equipment manufacturers. Nova Measuring Instruments Ltd. sells its products in the United States, Europe, Japan, and rest of the Asia Pacific region. The company was founded in 1993 and is headquartered in Rehovot, Israel.